OpTaliX Version 8.50

2013-01-27 00:01:35

Note that support of the 7.xx editions (blue Hardlock key, 32-bit only) has expired. This 7.98 update version is the last supported version. Users are encouraged to migrate to the new 8.50 version. This migration is free for users with a valid support license.


New Features in version 8.50:

• Support of Q-type aspheric surfaces based on a new mathematical formulation using orthogonal polynomials published by G.W.Forbes. Both Q-types, Qbfs and Qcon polynomials are fully implemented as special surfaces. See also the SPS QBF and SPS QCN commands.

• ISO lens element drawing: Added options to specify surface (polishing) grade and edge/chamfer ground symbols.

• Coating files may also be stored together with the optical design file in the same directory. It is no longer required to collect all coating files in a separate coating directory ($install$\coatings\). This option allows easier transfer of optical design and coating design files in a project like structure.

• Source structures or aperture masks defined in beam propagation analysis now may be loaded from bitmap images defined in files (BMP, PNG, PCX formats). This extends already predefined structures.

• Added option to calculate radial diffraction zones of symmetric holgrams. This option supports manufacturing of hologram surfaces, accessed from the manufacturing menu.

• Extended options to export coating properties (reflection, transmission, phase) to an ASCII file. The output file is a table over wavelength and incidence angles for given S/P polarization orientations, respectively average (S+P)/2 reflectivity/transmissivity. See also the EXP COA command.


Bug Fixes (versions 8.50 and 7.98):

• In macros, premature termination of while loops in macros corrected due to a parsing error.

• Illumination analysis with ray aiming option showed banding effects dependent on the number of processors used. This was a parallelization problem caused by incomplete data collection in multi-core environments.

• In tolerance analysis, systems are now correctly restored to the previous state. Previously, the system could have been left in the last tolerance state.

• Corrected ray trace on hole apertures in conjunction with tilted and/or decentered surfaces.

• A crash on repeated BPR calculations eliminated. This was caused by inappropriate memory allocation.

• Minor tweaks