OpTaliX Version 8.26

New Features (all versions 7.84 and 8.26):

• An option was added to set the threshold of warning messages for improperly index-matched coatings on optical substrates. Warning messages are disabled for ill-conditioned coating-substrate indices below this threshold. See preferences dialog, "misc" tab.

• In illumination analysis, exporting the illumination distribution has been decoupled from the illumination calculation itself. It is now possible to export illumination data after completion of illumination ray trace. A separate "Export" tab was added to the illumination option dialog.

• Improved optimization using hologram coefficients.

• Full 3D placement of illumination sources with respect to the object surface is now possible. Previously, tilts of the object surface were not supported in placing illumination sources.

• Export of transmission data to Excel/ASCII files now also writes the S and P polarization components separately. Previously, only average (mean) polarization was exported by default.

Bug Fixes (all versions 7.84 and 8.26):

• Paraxial properties (EFL, focus) of systems involving 2-point HOE/diffractive elements corrected. Creating melt glasses did not save CTE and specific weight values.

• Coatings attached to rear side mirrors (Mangin mirrors) were not used in the correct order during ray trace and transmission/polarization analysis.

• Transmission analysis in zoomed systems using coatings created spurious information output in the text window which slowed down analyses.

• Importing coating design files from MacLeod Thin Film Software improved. Elimitated occasional errors in opening MacLeod (*.dds) files. Now also correctly reads horizontal and vertival plot extents from dds-files.

• Eliminated a potential program crash in illumination analysis with thin-film coatings attached to surfaces, respectively transmission ray tracing activated.

• Minor tweaks